AOI Defect Inspection and Measurement Machine
With AOI-detected position data, high magnification, and wide field of view, you can capture defects with a click of a button. Zoom in with the mouse wheel to save on labor costs—it's self-evident!
General Microscope
Take this 50um black spot as an example: the human eye can hardly identify its location. Due to the high precision required, personnel need to operate the lens sequentially from low magnification > medium > high to correctly mark the flaw, which is "time-consuming and labor-intensive."
Review System
Using AOI-detected position data, combined with high magnification and wide-field selection, flaws can be photographed and identified quickly. Simply scroll the mouse to zoom in on the image, significantly saving on labor costs.
ReView System Specifications
• 2K color resolution
• TOYO dust-free slide rail
• LED ring light
• Ultra-high precision of 1.5μm
High-Resolution Imaging
Achieve low-noise and excellent image quality, ensuring the capture of the smallest details for complex image analysis.
Conical Convergence
Form a circular, high-brightness illumination area that covers the object under test, eliminating blind spots and enhancing visual inspection effectiveness.
Customized AOI System Configuration
First Station (Optional)
• Precision: 20um/pixel
• Color CCD Array
Station 2 (Optional)
• Precision: 20um/pixel
• Monochrome/Color CCD Array
Station 3 (Optional)
• Precision: 50um/pixel
• Tilt/Θ Angle/Focal Distance (Remotely Adjustable)
AOI Defect Comparison with Different Resolutions
Higher resolution enhances defect recognition and provides clearer details！
