Why do we need the ReView system?

In general quality control operations, it is nearly impossible to find mm or um level defects in samples with an area close to square meters (m²). Even with information provided by online CCDs, once off the production line, tasks cannot be quickly completed. Personnel still need to use tools like microscopes to search for marks one by one, which is time-consuming, laborious, and unreliable.

At this point, the ReView system can complete the task. The AOI system comprehensively detects surface defects. The ReView system photographs and measures the size of individual targets quickly, accurately, and analytically.